Conjugated polymers (CPs) are used in a wide variety of organic electronics such as photovoltaics, organic thin-film transistors (OFET), and flexible displays because of the increased flexibility of polymer-based electronics. However, CPs often have significant downsides such as being prone to environmental degradation, lacking mechanical robustness, and being overall very expensive to create and use. To combat these limitations, CPs can be blended with lower-cost commodity engineering plastics (CEP), such as polystyrene, to create a blended composite that forms nanoscale structures of CP in a CEP matrix. To characterize the blends, we use small-angle neutron scattering (SANS) and wide-angle x-ray scattering (WAXS), which are techniques that provide information in the form of a scattering pattern. After data reduction and background removal, SANS data can then be modeled to extract information about the structures that develop from 1 nm – 1000 nm. We have decided to focus on using the sphere, fractal, and parallelepiped models since those geometries often form from self-assembled CPs. The scattering pattern from WAXS can be used to determine the preferential growth direction of CP self-assembly, either along the pi-pi stacking or lamellar directions. Through the combined use of these techniques, we are able to characterize structural dependence on the choice of solvent including both moderate and good solvents for the CPs. We also tested different side-chain lengths on the CP which will affect solubility and the ability to self-assemble. From these experiments, we found that a moderate solvent (such as toluene) will encourage nanofiber formation growth at lower concentrations of CP. Control over nanofiber formation could potentially lead to more favorable electrical performance for these materials. Conductivity and rheology tests will be conducted which will allow us to determine how much of an effect solvent choice has on the mechanical and conductive properties of these blends.